Abstract
Abstract The physical principle of proposed sensor is based on the combination of two effects: the modulation of permittivity tensor elements in materials with induced anisotropy by external magnetic field and the creation of sharp minima in reflectance on prism base at guided mode resonance. As result we can observe pointed up the polarization states of reflected light beam influenced by external magnetic field. Procedures based on the Yeh’s 4×4 matrix formalism are described for the treatment of the electromagnetic interactions in prism-layered or -bulk structure with magnetic ordering. The tunneling phenomenon between coupling prism and inspected object is analyzed for ultrathin approximation and for the case of a gap spacing wide enough so that the prism could be considered as weak perturbation to the modes of the free structure. The value of Kerr rotation at resonant states achieves to one radian. Its dependence on in-plane modulation of magnetization direction offers the possibility to realize the magnetic vector sensor with angle distinguishing better than one degree.
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