Abstract
We have carried out polarised neutron reflectivity (PNR) and switching field distribution (SFD) measurements on both a single 60 nm CoCrPt film and a similar film bisected by a 5 nm spacer of Cr. The PNR data from the single film show that reversal can be understood in terms of a simple switching mechanism . That of the bisected film is more complex with two distinct quasi-independent switching processes. Moreover, the depth dependence of the neutron signal has allowed us to correlate each switching event with a particular layer. The switching behaviour is explained in terms of the film microstructure.
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