Abstract
Ferromagnetic resonance (FMR) measurements have been performed on single-crystal Fe films, produced by ion beam sputtering techniques on GaAs substrates. In-plane FMR results over the frequency range 0.1–20.0 GHz were obtained by a slot line technique. The magnetic parameters deduced from these measurements are comparable to bulk Fe. In-plane angular variation reveals a negligible uniaxial anisotropy contribution to the magnetic anisotropy energy. Spin-wave excitations were observed in 9.5-GHz cavity measurements, and are found to obey the n2 law. The exchange stiffness constant is found to be somewhat larger than seen in other epitaxial Fe films. These results show that epitaxial Fe/GaAs films possessing good magnetic properties may be produced by ion beam sputtering techniques.
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