Abstract
We examine the magnetic properties of samarium-cobalt thin films on quartz and Si(111) substrates grown by dc magnetron sputtering. Both films are deposited on Cr buffer layer and subsequently a capping layer of Cr was also deposited. Secondary ion mass spectroscopy results reveal that Cr diffused in to Sm-Co layer.This lead to local change in magnetocrystalline anisotropy. As the result of this we observed the two coercive behaviors in magnetization of thin film.
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