Abstract
We examine the magnetic properties of samarium-cobalt thin films on quartz and Si(111) substrates grown by dc magnetron sputtering. Both films are deposited on Cr buffer layer and subsequently a capping layer of Cr was also deposited. Secondary ion mass spectroscopy results reveal that Cr diffused in to Sm-Co layer.This lead to local change in magnetocrystalline anisotropy. As the result of this we observed the two coercive behaviors in magnetization of thin film.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
