Abstract
(Fe50Co50)(1-x)-Gdx thin films (30 nm) with x<15% deposited on silicon substrates by magnetron sputtering were investigated by X-ray diffraction, vibrating sample magnetometer, and ferromagnetic resonance. Theoretical fittings of the angular dependent ferromagnetic resonance field of the FeCoGd films have been performed using the Landau-Lifshitz equation It is found that the ferromagnetic resonance experimental data is well fitted by the theory and various magnetic properties have been extracted in accordance. The saturation magnetization decreases from 22750 Oe at x = 0% to 14079 Oe at x = 14% in the FeCo-Gd film, and the perpendicular magnetic anisotropy has changed from an easy film plane to an easy film normal geometry. The gyromagnetic ratio, as well as the Landé g factor, are found increased also with increasing Gd content, i.e. from g = 2.08 at x = 0% to g = 2.29 at x = 14%. An enhancement of the L-S coupling in the presence of a low Gd content has been concluded based on an observable increase from 0.011 at x = 12% up to 0.015 at x = 14% in the Gilbert damping.
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