Abstract
The multilayer thin films having the form of Ti(30 nm)/Fe(dFe)/[Nd–Fe–B(dNd–Fe–B)/Fe(dFe)] ×5/Ti(30 nm)/glass were fabricated on glass substrates by means of radio frequency (rf) sputtering, with dFe varied from 0 to 50 nm and dNd–Fe–B from 0 to 100 nm. Magnetization measurements have revealed that the minor loops of the films are reversible in a certain range of demagnetization fields except for the films with dFe∼0 nm or dNd–Fe–B<10 nm. Micromagnetic calculation of magnetization curves has been performed, which has well reproduced the observed hysteresis loops including spring-back behavior and the dependence of the coercive field HcJ on dFe and dNd–Fe–B. From the comparison between experiment and calculation, we can infer that the interlayer exchange-coupling strength is about 10% of the intralayer couplings, which are found to be almost independent of dFe and dNd–Fe–B.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
