Abstract
Conversion Electron Mössbauer Spectroscopy (CEMS) and DC magnetization are used to compare magnetic properties of as-deposited multilayer (MLS) and Fe2CrAl thin film made from Al/57Fe/Cr MLS deposited by ion beam sputtering and then annealed in UHV. Interdiffusion of elements on annealing sample-1 at 500°C leads to formation of a single, disordered film of Fe2CrAl as evidenced by hyperfine field values obtained by CEMS in the film which compares well with that in bulk Fe2CrAl. CEMS also shows contributions from Fe, Fe/Cr and Fe/Al interfaces in the MLS. Saturation magnetization of as-deposited sample-1 is much less than pure Fe due to reduced Fe thickness because of interface formation and also reduction in Fe-Fe interaction due to intervening Al and Cr layers.
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