Abstract
Pseudobinary SmCo 7 − x Cu x intermetallic compound films with a TbCu 7-type structure were prepared by sputtered (SmCo 7/Cu) n multilayer. After annealing, the spacer layer Cu (0.5–1.5 nm) diffused into the SmCo 7 matrix and stabilized the SmCo 7 meta-stable phase. The resulting microstructure was investigated by transmission electron microscopy. Perpendicular anisotropy was obtained by introducing a Cu/Ti dual underlayer during sputtering, resulting in prefer-orientated SmCo 7 (00L) X-ray diffraction peaks. This study observes a maze-like domain pattern in perpendicular anisotropy films and finds single- and multi-domain particles in correlated AFM and MFM images.
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