Abstract

The magnetic properties and microstructure of Pr-Fe-B thin films with addition of Fe composition were investigated. Fe was added during the deposition process of Pr-Fe-B layer on Si3N4 underlayer and glass substrate. XRD measurement indicated the appearance of Pr2Fe14B and Pr2Fe23B3 phases in the thin films. The thin films at low Fe content revealed a strong reflection of Pr2Fe23B3 phase. Magnetic measurement showed that high Fe content caused a decline of the magnetic properties of the thin films. A proper Fe content of at 75.53 at.% showed a high coercivity and the presence of magneto-crystalline anisotropy. SEM and AFM results showed the surface characteristics of the thin films. XRD and TEM results indicated the formation of Fe3Si layer at the interface of Pr-Fe-B layer/Si3N4 underlayer. The Fe3Si phase only promotes the epitaxial growth of Pr2Fe14B phase. XPS depth profile demonstrated the distribution of atoms in microstructure of the thin films.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.