Abstract
The thickness–roughness phase diagram of a thin ferromagnetic film on an antiferromagnetic substrate is studied in the case where the roughness of the interface between the layers causes frustration of the exchange interaction between them. It is shown that the account of single-ion anisotropy makes the phase diagram significantly more complicated in comparison with that calculated within the exchange approximation. The evolution of a new type of domain walls caused by frustrations is traced with an increase in the film thickness and the width of the atomic steps on the film–substrate interface.
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