Abstract
Ultrathin films of Co were grown on Cu(100) and characterized by nanometer resolution secondary electron microscopy, Auger electron spectroscopy, and the surface magneto-optic Kerr effect. An unexpected out-of-plane remanence was detected in many films. The anisotropy of atoms near defects along the Co/vacuum interface calculated via the Néel model indicates that atoms at the bottom corner of a step edge are canted out-of-plane. Full three-dimensional micromagnetics simulations which incorporate site specific anisotropy (including step edges, kinks, and voids) have been performed. Simulations with unidirectional arrays of [11_0] steps, such as vicinal surfaces, do not exhibit out-of-plane remanence. Simulations with facets consisting of connected [110] and [11_0] steps exhibit out-of-plane remanence of 0.03. This is lower than the experimental value of 0.11.
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