Abstract
Magnetic field images of high- T c thin film patterns with various size and a single-flux-quantum (SFQ) sampler chip cooled in a weak magnetic field have been taken by a scanning SQUID microscope system in which the sample temperature can be varied between 4 and 100 K. The images of flux quanta trapped in (Hg, Re)-1212 and Nd-123 thin film patterns are clearly observed in a wide temperature range. The critical field as a function of line width for complete flux expulsion is confirmed to agree well with Clem's prediction. In the magnetic images of the sampler chip, some features peculiar to its multilayer structure are found.
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