Abstract
Measurements of the magnetic-field and temperature-dependent Hall effect of thin epitaxial UPd 2Al 3 films with various defect densities were performed. In high-quality films the Hall coefficient R H ( T) is positive and is dominated by skew scattering at elavated temperatures, passes a maximum at 55 K and decreases with further decreasing temperature. At 6K to 7K a minimum occurs followed by a quadratic saturation behaviour for T → 0. Positive and negative residual Hall coefficients R H ( T = 0) were observed. As a function of the applied field ( B ≤ 12 T) the Hall resistivity shows a nonlinear behaviour in the whole temperature range that was investigated (2 K to 35 K).
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