Abstract
SmCoR (R=Al,Si,Ti,Nb,Cu)/Cr series films were fabricated as one kind ofpromising materials for the ultrahigh density longitudinal magneticrecording media. The Sm(Co,Al,Si)/Cr thin films with coercivity up to2.36 kOe, squareness ratio S near 0.94 and coercive squarenessratio S* about 0.9 were obtained. The Cr interlayercaused magnetic decoupling in Sm(Co,Al,Si)/Cr/Sm(Co,Al,Si) thinfilms. High coercivity of 3400-3840 Oe and extremely fine grain size of5-8 nm for the magnetic layer were examined. Using different substratebias among the Sm(Co,Al,Si)(deposited with substrate bias of-150 V)/Sm(Co,Al,Si)(deposited with no substratebias)/Sm(Co,Al,Si)(deposited with substrate bias of -150 V), themultilayer exhibited high coercivity of 2960 Oe and S*of 0.96. Sm(Co,Al,Si)/Sm(Co,Ti,Cu)/Sm(Co,Nb,Cu) trilayer improvedmatching between the magnetic layer and the Cr underlayer, and led toincreasing in-plane anisotropy, high coercivity of 3280 Oe andS* of 0.92. Lattice matching of SmCoR {112̄1} and Cr{110}, etc. were found under various conditions. The microstructuresof these four kinds of medium were also examined. The results suggestthat it is possible to produce Sm(Co,Al,Si,Ti,Nb,Cu) multi-layer mediawith the combined magnetic properties required for the ultrahighdensity magnetic recording.
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