Abstract
Polycrystalline BiFeO3 thin films on ITO glass substrates were prepared by radio frequency magnetron sputtering using a Bi1.1FeO3 target. The samples which were annealed with different annealing conditions are pure without impurities. We measured the magnetic properties and ferroelectricity of the BiFeO3 films. The measurement results show that the magnetic and electrical properties of the BiFeO3 films are significantly different under different annealing conditions.
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