Abstract
A series of martensitic Ni52Mn24Ga24 thin films deposited on alumina ceramic substrates has been preparedby using RF (radio-frequency) magnetron sputtering. The film thickness,d, variesfrom 0.1 to 5.0 µm. Magnetic domain patterns have been imaged by the MFM (magnetic forcemicroscopy) technique. A maze domain structure is found for all studiedfilms. MFM shows a large out-of-plane magnetization component and arather uniform domain width for each film thickness. The domain width,δ, depends on the film thickness as in the whole studied range of film thickness. This dependence is the expected one formagnetic anisotropy and magnetostatic contributions in a perpendicular magnetic domainconfiguration. The proportionality coefficient is also consistent with the values ofsaturation magnetization and magnetic anisotropy determined in the samples.
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