Abstract

AbstractWe report the results of temperature dependent, Mn K-edge X-ray Absorption measurements: Magnetic X-ray Circular Dichroism (MXCD) for local magnetic properties and X-ray Absorption Near Edge (XANES) for electronic and structural properties of Mn-based oxide magnetoresistive compounds La1−xSrxMnO3. This is the first report of an MXCD signal of the Mn K-edge in Mn oxide systems. By studying the integrated peak intensity of the first peak in the MXCD signal, it can be determined that the magnetic properties of the system are independent of temperature in the range 94 to 223K.

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