Abstract
Films of Co2Fe-Ge Heusler alloy with variable Ge concentration deposited on monocrystalline MgO (100) substrates by magnetron co-sputtering are investigated using microstructural, morphological, magnetometric, and magnetic resonance methods. The films were found to grow epitaxially, with island-like or continuous-layer morphology depending the Ge-content. The ferromagnetic resonance data versus out-of-plane and in-plane angle indicate the presence of easy plane and 4-fold in-plane anisotropy. The magnetometry data indicate additional weak 2-fold in-plane anisotropy and pronounced at low fields rotatable anisotropy. The observed magnetic anisotropy properties discussed in correlation with the microstructure and morphology of the films.
Highlights
Some of the full-Heusler alloys (FHA) are half-metallic ferromagnets,[1] described by the formula X2YZ, where X and Y are transition metals and Z is an sp group element
FHA materials are promising for use as electrodes in magnetic tunnel junctions and spin valves.[3,4,5]
(Co2Fe)xGe100x films were grown on monocrystalline MgO (001) substrates, in the same deposition run as the (Co2Fe)xGe100x films on oxidized (001) Si.[6]
Summary
Some of the full-Heusler alloys (FHA) are half-metallic ferromagnets,[1] described by the formula X2YZ, where X and Y are transition metals and Z is an sp group element. Magnetic anisotropy of epitaxial Co2Fe-Ge Heusler alloy films on MgO (100) substrates
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