Abstract
Thin films of Co-Ni/Cr were sputtered onto Ni-P plated substrates by in-line DC magnetron sputtering. The observation of the film surface clarified that the textures on the substrate generate gaps in the film. Electron diffraction patterns showed crystalline orientation in the direction perpendicular to the disk movement. It is known that the circumferential textures on the substrates enhance the read-write characteristics and the oblique incidence by the disk travel during sputtering induces a bimodal modulation of a read-back signal envelope. The origins of these two types of the magnetic anisotropies were able to be explained by the above-mentioned two experimental results.
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