Abstract
Mn Ge P 2 films were grown on undoped GaAs(001) substrates by molecular beam epitaxy. X-ray diffraction analysis reveals a film peak at 66.21°, corresponding to a c-axis of 1.128nm for the chalcopyrite structure. Superconducting quantum interference device magnetic measurements show ferromagnetic order in the film with a transition temperature around 325K and hysteresis loop measurements yield with coercive fields of about 1600Oe and 210Oe at 250K and 300K, respectively. The transport measurements exhibit nonmetallic behavior with p-type carriers and a carrier density increasing with temperature. The anomalous Hall effect (AHE) is observed in the film indicating spin polarized carriers. At low temperatures, the anomalous Hall resistance has a negative sign and decreases in magnitude with increasing temperature, changing sign around 150K. It then increases with temperature, reaching a maximum around 250K.
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