Abstract
The magnetotransport behaviors of two types of permalloy nanostructures, thin films and antidots, are presented and discussed. Antidots samples were prepared by sputtering a Ni80Fe20 layer on top of a nanoporous alumina membrane. A counterpart continuous thin film grown on a continuous Si substrate was also prepared. The magnetoresistance (MR) was measured both as a function of the external applied magnetic field and of the angular orientation, and thus compared with the magnetization curves. The introduction of antidots is found to reduce the anisotropic MR and the angular dependence of the MR, simultaneously increasing the coercive field of the samples. The influence of the sample geometry on the perpendicular MR behavior is reported and discussed.
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