Abstract
We have investigated the effects of swift heavy ion irradiation on thermally evaporated 44nm thick, amorphous Co77Fe23 thin films on silicon substrates using 100MeV Ag7+ ions fluences of 1×1011ions/cm2, 1×1012ions/cm2, 1×1013ions/cm2, and 3×1013ions/cm2. The structural modifications upon swift heavy irradiation were investigated using glancing angle X-ray diffraction. The surface morphological evolution of thin film with irradiation was studied using Atomic Force Microscopy. Power spectral density analysis was used to correlate the roughness variation with structural modifications investigated using X-ray diffraction. Magnetic measurements were carried out using vibrating sample magnetometry and the observed variation in coercivity of the irradiated films is explained on the basis of stress relaxation. Magnetic force microscopy images are subjected to analysis using the scanning probe image processor software. These results are in agreement with the results obtained using vibrating sample magnetometry. The magnetic and structural properties are correlated.
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