Abstract
Er thin films with their c-axis perpendicular to the film plane were prepared on Nb buffer layer deposited on an Al 2O 3 substrate. The magnetic and structural properties change radically between the samples with and without the Y capping layer on Er film. Er films without the capping layer show periodic change both in magnetic and structural properties as a function of Er thickness with a period of about 20 Å, while Er films with the capping layer do not. These results give an experimental evidence for the interpretation proposed before on the periodic change in terms of the quantum interference effect.
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