Abstract
Highly oriented M-type barium ferrite (BaM) thin films were deposited by sputtering on Pt-coated Si Substrate with different substrate temperatures. X-ray diffraction and atomic force microscopy results show that BaM films have crystal texture of c-axis grains perpendicular to film plane with apparent hexagonal morphology. On the other hand, it is clearly observed that the remanent magnetization (Mr) in out-plane is higher than those in in-plane, and the Mr in out-plane increases with increasing the substrate temperature, reaching maximum when substrate temperature (Ts) is 600 °C. The hysteresis curves also indicate that the BaM thin film exhibits nice self-biased property with 4πMr of 3803.04 Gs, squareness ratio (Mr/Ms) of 0.96, and coercivity of 1767.3 Oe. These results make sure that these BaM films have potential for use in self-biasing microwave/millimeter wave magnetic devices such as circulators and isolators.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
