Abstract
CoCrPtTa thin film media using Cr as an underlayer has been developed as a candidate for future high density longitudinal recording. In an effort to reduce the lattice mismatch between the Cr underlayer and the magnetic layer, the Cr underlayer has been doped with various elements. In this work the effect of adding Wx (x=10 and 15 at. %) to the Cr underlayer on the magnetic, crystallographic, and recording properties are reported. CrW10(Cr90W10) underlayer produced about 400 Oe higher coercivity and higher S* at Mrt≈0.60 memu/cm2 compared to the Cr underlayer. Also at 240 kfci recording density for CoCrPtTa/CrW10 media the normalized media noise was similar and signal-to-noise ratio was about 2 dB higher compared to the CoCrPtTa/Cr media. For the CrW15(Cr85W15) underlayer at Mrt≈0.60 memu/cm2 the coercivity was about 300 Oe higher with S*=0.88, but the normalized media noise was also higher than the CoCrPtTa/Cr media. The x-ray diffraction data suggest better lattice match between the CoCrPtTa/CrW10 media due to the addition of W to the Cr underlayer compared to the CoCrPtTa/Cr media. The magnetic and recording properties are correlated to the crystallographic properties of the CoCrPtTa/CrW thin film media.
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