Abstract
An epitaxial thin film growth has been applied to prepare bicrystalline CoCrPt longitudinal recording medium using an MgO(100) single crystal disk substrate. X-ray and TEM measurements have revealed that the magnetic layer has a bicrystalline structure which consists of two variant domains with their c-axes lying in-plane and perpendicular-to each other. The maximum medium coercivity is observed at (2n+1)/spl pi//4, while the minimum coercivity is observed at n/spl pi//2 from the MgO[010] when measured along the circumferential direction. The highest signal to noise ratio, the highest linear resolution, and the best off-track performance are observed at (2n+1)/spl pi//4 where the direction of the recording magnetic head field lies between the easy magnetization axes of the two variant domains.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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