Abstract
Static magnetic properties, ferromagnetic resonance (FMR) and glancing angle X-ray diffraction spectra (GAXRD) of (CoFeB)/(nonmagnetic interlayer) nanosystems have been studied for three kinds of interlayers: dielectric (SiO2) and semiconductors (Si and SiC). Matter of discussion is the role of the interlayer material in forming of inner structure of magnetic layers and magnetization curve shape.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
