Abstract
The temperature and bias field dependences of macroscopic, measured by pulsating load method, and local, measured by piezoresponse force microscopy, longitudinal piezoelectric responses have been studied in (001)-oriented flux-grown (1 − x)Pb(Mg1/3Nb2/3)O3–xPbTiO3 (0.0 ≤ x ≤ 0.29) single crystals. Both types of responses exhibit a dramatic enhancement with increasing bias fields. At the same time, their temperature maxima shift from the Vogel-Fulcher temperature to the vicinity of the dielectric permittivity maximum, where the critical point in the E-T phase diagram is located. Both datasets confirm a quasicritical nature of the giant field-induced piezoelectric response in relaxor single crystals.
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