Luminous Properties and Thermal Reliability of Screen-Printed Phosphor-in-Glass-Based White Light-Emitting Diodes

Abstract

This paper systematically investigates the luminous properties and thermal reliability of phosphor-in-glass (PiG)-based white light-emitting diodes (WLEDs). The PiG was prepared by introducing yellow YAG:Ce3+ phosphor embedded with borosilicate glass through screen-printing and low-temperature sintering. The effects of sintering temperature, phosphor content, and phosphor layer thickness were studied, and then the optimized PiG was achieved. This PiG-based WLED module yields a luminous efficacy (LE) of 114 lm/W, a correlated color temperature of 5524 K, and a color rendering index of 69 at the driving current of 700 mA. Furthermore, after thermal aging test at 200 °C for 500 h, the photoluminescence intensity of PiG is only reduced by 4.3%, which is much lower than the conventional phosphor-in-silicone (PiS) of 26.2%. The LE losses of PiG-based and PiS-based WLED modules are 4.2% and 12.1% after thermal aging of 1000 h at 100 °C, respectively. The aging results show that the proposed PiG exhibits superior thermal stability characteristic, which promises the excellent thermal reliability for PiG-based WLEDs.