Abstract
Cr3+: ZrSiO4 ceramics with different concentrations of Cr3+-doped were prepared by a simple solid-state reaction method, and the effect of Cr3+ concentration on the photoluminescence of ZrSiO4 samples was investigated. The X-ray powder diffractometer (XRD) was used to analyze the structural characteristics of the samples. The XRD results show that zirconium silicate has been completely synthesized at 1400°C, which indicates that Cr3+ enters into the lattice of ZrSiO4, but does not change the structure of it. The emission spectra of ZrSiO4 were measured by the fluorescence spectrometer. The strongest emission peak was at 689nm, which was attributed by the 2E-4A2 of Cr3+. The influence of different concentrations of Cr3+ on the luminescence of zirconium silicate was investigated. When the concentration of Cr3+ is 0.1mol%, the luminescence intensity of the samples is the highest. When the concentration of Cr3+ is 0.5mol%, the intensity of the emission spectrum decreases, which is due to the concentration quenching of Cr3+ in the crystal lattice. Finally, the influence of charge compensator ions on the emission intensity of the sample is explored. The results show that the emission intensity of the zirconium silicate samples is improved when the appropriate amount of Li ion is added.
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