Luminance Compensation and Optimization to Delay OLED Degradation Based on Equivalent Lifetime Detection

Rui Fan,Zhentao Tu,Xiaoning Zhang

doi:10.1109/jeds.2020.3001657

Rui Fan, Zhentao Tu + Show 1 more

Open Access

https://doi.org/10.1109/jeds.2020.3001657

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Abstract

In this paper, luminance compensation and optimization without internal or external sensing circuits to delay OLED degradation based on equivalent lifetime detection is proposed. The proposed method can estimate the dynamic luminance degradation with the equivalent lifetime equation derived by converting display time of any OLED cell at different luminance to a reference display time at a certain luminance. According to the calculated equivalent lifetime, luminance compensation is carried out by increasing drive current. In order to obtain a better lifetime extension of the OLED, three key parameters, such as compensation iteration m, compensation goal value L goal , and compensation origin value L origin are optimized. Experimental results indicate that the relative error of dynamic luminance degradation estimation is about 2.2% with the proposed method. The lifetime of OLED cells can be prolonged by 32.64% with the optimized parameters m = 5, L origin /L 0 = 0.75, and L goal /L 0 = 0.83.

Highlights

Organic Light Emitting Diode (OLED) has attracted significant attention due to its high contrast, low power consumption, self-light emission, high color reproduction ranges and other advantages [1]
We propose a novel luminance compensation and optimization method by calculating the degradation degree of the OLED
The verification system consists of five OLED samples, which contain a total of twenty-five light-emitting cells

Summary

INTRODUCTION

Organic Light Emitting Diode (OLED) has attracted significant attention due to its high contrast, low power consumption, self-light emission, high color reproduction ranges and other advantages [1]. There are a few external circuits compensation methods, which need sensing circuits and additional circuit components to delay the luminance degradation. All of the above methods require additional sensor circuits to detect the degradation degree of OLED [15], [16], which needs a period of time setting aside before the display cycle for detection. Lifetime estimation based on Weibull distribution and experimental test has been studied [17], [18] This method is not conductive to obtain the aging status of OLED in real time. The method can calculate the luminance degradation without any internal or external sensor circuits based on a proposed equivalent lifetime method.

EQUIVALENT LIFETIME METHOD

RESULTS AND DISCUSSION

CONCLUSION