Abstract
The scintillator film, as a key element affecting X-ray detection imaging resolution, has attracted more and more attention. At present, it is mainly obtained by grinding and polishing of crystal or ceramic scintillators and film evaporation technology, with high cost, limited size and long preparation period. In this work, we propose a simple method to prepare scintillator films by blending (Lu0.995Ce0.005)3Al5O12 nano-powders and polydimethylsiloxane (PDMS), and characterize the uniformity, light absorption, photoluminescence, and X-ray excited luminescence (XEL) of these. The XEL results show that the prepared LuAG:Ce-PDMS composite scintillator films have a clear broadband emission in the region of 480 and 680 nm, which can be well coupled with silicon photodiodes. Its XEL integral intensity is 286% that of commercial BGO scintillators, and the spatial resolution is 25 lp/mm when the film thickness is 100 μm. All of those show the LuAG:Ce-PDMS composite scintillator films have a potential application in scintillator-based indirect-type X-ray imaging.
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