Abstract
ZnxCd1-xTe is an important crystal used in room temperature x-ray and gamma ray detectors. ZnxCd1- xTe single crystals with varying values of x were grown using the traveling heater method and were purchased from a commercial vendor. The crystals were cleaved and etched. Electrical contact layers of Au were deposited to form a radiation detector. In order to reduce defect formation under the contact layer, we have developed a new deposition process which does not involve the use of vacuum, is performed at a low temperature, is low cost, and results in thin, ultra smooth, uniform, high density films with sharp interfaces. X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) were used to characterize the chemical composition and surface morphology of the thin film of Au. The surface characterization and radiation response properties of these crystals are presented and discussed.© (1996) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
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