Abstract

We report consiaerabe success in using the technique of laser annealing to reduce scattering in a variety of thin-film optical waveguides deposited onto thermally-oxidized silicon substrates. For the materials Si 3N4, Nb90,, and Ta205 values of waveguide loss less than 1 oB/cm were achieved. Values of waveguide loss as1UW as'.01 db/cm nave been measured for laser-annealed Zn0 waveguides and for Corning 7059 glass wave-guides which have been both laser anneal ea and had surface coatings applied.© (1982) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

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