<title>Scattering of electromagnetic waves from a one-dimensional random metal surface with a localized defect</title>

Abstract

We study theoretically the scattering of a beam of s-polarized light from a one-dimensional random metal surface with a localized deterministic defect. We carry out numerical calculations of the far field intensity, using a formally exact technique based on Green's second integral identity and statistical ensemble averaging. Our results obtained for very rough surfaces show that the backscattering peak in the differential reflection coefficient for the scattered light almost does not change for small angles of incidence. However, for larger angles it undergoes significant enhancement due to the presence of the defect, which phenomenon we attribute to a form of the corner cube effect. We also consider how the presence of a deterministic defect changes the behavior of the angular intensity correlation function for the scattered light. We are primarily interested in the changes of the memory effect and the time-reversed memory effect peaks. We show that the defect can enhance or suppress these peaks depending on the relative positions of the light sources and the points of observation. The explanation of these results is again associated with the corner cube effect.