Abstract
The reflection-back-to-the-fiber SNOM under shear-force control with sharp and cold uncoated tips provides reliable submicroscopic resolution on rough surfaces without topographic artifacts. The high lateral resolution is the result of a sudden increase in reflectivity when the tip goes close to the surface at about 50% vibration damping. This technique has been tested for samples of piratical importance in the field of organic colorants and for Raman spectroscopy.
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