<title>Reliability assurance of optoelectronic devices in the local loop</title>

Abstract

Rapid development of Fiber-In-The-Loop (FITL) systems and FITL technology is bringing new challenges for assuring the reliability of optoelectronic devices. This can be attributed to several factors, some of which include: architecture, cost, useful lifetime of the optical source, and environmental conditions. Presently, relatively little is known about optoelectronic device reliability in the local loop. Thorough studies on the impact of loop applications and environments on the reliability of optoelectronic devices are essential. Although this paper will attempt to touch on most of the factors that need to be considered in any such study, the primary focus will be on the possible impact of loop environments on the reliability of optoelectronic devices and the methods required to help assure their reliability.