Abstract
We propose a double injection current transient technique to study the charge carrier mobilities and recombination in thin films of bulk heterojunction structures. This experimentally simple technique allows estimation of bimolecular recombination coefficient and charge carrier mobility, either of a sum of electron and hole mobilities in double injection into insulator mode, or the ambipolar mobility in semiconductor mode. The double injection current transient technique is used to study RRPHT/PCBM bulk heterojunction solar cells, and the obtained results are compared with results obtained using TOF and CELIV techniques.
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