Abstract
We have demonstrated the sub-10-ps time-resolved measurement of the x-ray absorption fine structure (XAFS) in laser-excited Si foil by using a femtosecond laser-produced plasma soft x-ray as a probe. We observed a rapid change and recovery in the absorption structure near its L<sub>II</sub>,<sub>III</sub> edge induced by 100-fs laser pulse irradiation when the laser intensity was in the 10<sup>9</sup>-10<sup>10</sup> W/cm<sup>2</sup> range. When the incident laser intensity was of the order of 10<sup>12</sup> W/cm<sup>2</sup>, which is higher than the damage threshold, the extended x-ray absorption fine structure (EXAFS) signals clearly revealed inter atomic distance expansion and structural disordering as well as a change in the electronic structure caused by the production of liquid Si. We also describe our recent results on spatio-temporally resolved soft x-ray absorption in an expanding ablated particle cloud from aluminum that was heated with a 10<sup>14</sup>-W/cm<sup>2</sup>, 100-fs laser pulse by using an imaging system for time-resolved soft x-ray absorption spectroscopy.
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