<title>Phase retardance and optical extinction symmetry measurements for some birefringent materials</title>

Abstract

Results of highly sensitive phase retardance and optical extinction symmetry measurements using a precision ellipsometry apparatus are described. Quartz wave plate retardance measurement accuracy was enhanced through the use of three laser wavelengths at 1064, 632.8, and 532 nm. Optical extinction symmetry phenomena in crystal quartz, KNbO<SUB>3</SUB>, Nd:YVO<SUB>4</SUB> and TiO<SUB>2</SUB> was also investigated in order to correlate variations in retardance measurements to crystal quality and orientation accuracy.