Abstract

A new confocal scanning beam transmission and reflection microscope is described. The new microscope uses the same detector for both transmitted-light and reflected-light images. The transmitted beam is re-injected into the optical path of the microscope parallel to the reflected beam and the same scanning mirrors are used to descan the two beams. A set of identical objective lenses collect reflected and transmitted light from both the top and bottom of the specimen, recording images with perfect registration. Several images of biological and semiconductor specimens are presented that illustrate the advantages of confocal transmission microscopy. The first scanning-beam confocal transmitted-light differential phase contrast image is also presented.

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