Abstract

A new approach for a practical, easy to implement reliability estimation procedure for microsystems (MS) is presented. The proposed procedure is based on the combined use of a number of reliability data sources, deterministic models and calculation methods for MS components. Some criteria needed to assess the value of a reliability prediction procedure are established. For the first time these criteria are chosen to specific features of MS subfunctions and components. To be obtained realistic test data for all MS component a qualification for them are designed.

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