Abstract

An interferometric approach to the calculation of the two-dimensional MTF of an optical system is proposed. The technique, in some ways analogous to that of speckle interferometry used in astronomical situations, is based on the computation of the second-order spatio-temporal statistics of a fluctuating speckle pattern. The theorum of Van Cittert-Zernike is invoked to relate the speckle, due to illumination of a perfect diffuser by the point spread function of an optical system, to the two-dimensional MTF of the system. The computed MTF is displayed in the form of a contour map and can also be represented in the conventional form of a one-dimensional vertical cut. Preliminary measurements have yielded qualitatively useful results and clearly illustrate the suitability of two-dimensional maps for the detection of transfer function anisotropies.© (1979) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.