Abstract

The amplitude and phase of ultrashort optical pulses generated by modelocked lasers yield information about the physical mechanisms that shape the pulse inside the laser. The form of the electric field of pulses with a duration of several tens of femtoseconds can only be retrieved through indirect diagnostic techniques, however. A number of protocols for determining the pulse field envelope have been developed in the past several years and, in this paper, we discuss the application of two pulse measurement techniques, including a novel linear interferometric method, to the measurement of the pulses from a colliding pulse modelocked (CPM) dye laser and a self-modelocked Ti:Sapphire laser.

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