Abstract

Cluster analysis is an important part of pattern recognition. In this paper we present the applicability of one neural network model, namely Kohonen self-organizing feature map, to cluster analysis. The aim is to develop a method which could determine the correct number of clusters by itself. First, the general concept of neural networks and detailed introduction to Kohonen self-organizing feature map are discussed. Then, the suitability of Kohonen self- organizing feature map to cluster analysis is discussed and some simulations are presented.© (1994) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call