Abstract

In conventional IR-sensors, there are problems of needing cooler and sensing wavelength limitation. These problems can be achieved by using un-cooling thermal IR senors. However, they raise the problems of the attack of pyroelectric thin film layer during the etching of sacrificial layer as well as the thermal isolation of the IR detection layer. In order to fabricate uncooled IR-sensor using pyroelectric film, multilayer should be prepared pyroelectric thin film and thermally isolating membrane structure of square-shaped microstructures. We used the direct bonding technique to avoid the thermal loss by silicon substrate and the attack of pyroelectric thin film by etchant of the sacrificial layer. Metallic Pt layer used as a top and a bottom electrodes were deposited by E-beam sputtering method, while pyroelectric thin films were prepared Sol-Gel techniques. Because the pyroelectric thin film with c-axial orientation raised thermal polarization without the polling, the more integrated capability could be achieved. We investigated the characterized of the pyroelectric thin films: P-E loop, dielectric constant, XRD etc.© (1999) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.