Abstract

Abstract A study of the effects of secondary electron emission on charge pulses from a microchannel plate (MCPs) photon countingdetector with crossed delay line (CDL) anode readout is presented. The detector is a two-dimensional photon countingdetector with fast count rate and good spatial resolution being developed at Los Alamos National Laboratory. The CDLanode is constructed of two orthogonal planar pairs of helically wound wires on inner and outer ceramic sides attached to a copper ground plane. The electron cloud event from the MCPs interacts with the wires generating a signal pulse. The electrons that strike the wire with sufficient energy generate secondary electrons. A model is presented for the charge pulsesfrom the CDL anode incorporating the effects of secondary electron emission. An empirical test of the model is conductedwith two different wire materials using a demountable MCP/CDL detector. Charge pulses are measured and the results arecompared to the model. The results show that the charge pulses from the CDL anode are material dependent and exhibit thegeneral behavior predicted by the model. Secondary electron emission is an integral part of the CDL anode charge pulses andmust be considered in further developments of the CDL anode readout.Keywords: Crossed delay line anode, microchannel plates, secondary electron emission, position sensitive detector

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