Abstract
Interferometric techniques have been employed by a number of investigators to determine the phase modulating characteristics of popular spatial light modulators. The technique works well but requires the set-up and operation of a sensitive interferometer. A non-interferometric technique is presented for determining the phase modulating characteristics of spatial light modulators. Examining the far field diffraction pattern distribution for specific input functions allows the phase modulation to be calculated. The degree of phase modulation appears in the Fourier transform as an intensity modulation which can be measured. Results are compared with usual interferometric techniques for a liquid crystal based modulator.© (1996) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
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