Abstract
In this contribution we describe the similarities and especially the differences arising when typical methods for the characterization of optical channel waveguides are applied to waveguides fabricated in different substrates that strongly differ in the refractive-index contrast. Behavior of straight channel waveguides fabricated by i) ion-exchange technique K+ ↔ Na+ or Ag+ ↔ Na+ in borosilicate or Er doped silicate glasses, ii) Ti-diffusion into the LiNbO<sub>3</sub> substrate, and iii) silicon-on-insulator technology will be compared. Fabry-Perot resonator method based on a highly coherent fine-tunable semiconductor laser using different types of end-fire coupling arrangements will be described. Measurements of basic parameters of the optical waveguides, e.g. optical field distribution, optical losses, group effective index and their spectral dependencies will be presented and their features typical for particular waveguide structures will be compared.
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