Abstract
The ultrafast optoelectronic technique of coherent microwave transient spectroscopy (COMITS) is applied to the measurement of photonic band structure phenomena in 2-D periodic dielectric arrays. The phase sensitivity of COMITS is exploited to measure the dispersion relation of electromagnetic radiation propagating in regular arrays of alumina ceramic rods. An attenuated-total-reflection configuration is used to demonstrate the coupling of microwave radiation to electromagnetic surface modes which exist at the interfaces of suitably terminated photonic crystals.
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